Published December 15, 1993 | Version v1
Journal article

One and two electron processes in collisions of highly charged ions with He at velocities around 1 a.u

  • 1. J. R. Macdonald Laboratory, Kansas State University, Manhattan, Kansas 66506 (United States)

Description

We have studied one and two electron processes in collisions of Ar16+ and O8+ ions with He atoms at velocities between 0.23 and 1.67 a.u. These processes were identified by measuring the final charges of the projectile and recoil ions in coincidence. Single electron capture (SC) is the dominant process at all our velocities. Transfer ionization (TI), where the He loses both electrons but the projectile captures only one, is next largest. Double capture (DC) and single ionization (SI) are about 10 times smaller, with DC larger for Ar and SI negligible for O. None of these processes show any dramatic velocity dependence. The energy independence of SI is somewhat surprising as our measurements span the velocity region where ionization would be expected to increase. Our analysis suggests that the ionization process is being suppressed by SC and TI processes. The average Q-values for capture channels were determined by measuring the longitudinal momenta of the recoiling target ions. The Q-values for both SC and TI decrease with increasing projectile energy, which indicates that electrons are captured into less tightly bound states as the collision velocity is increased

Additional details

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
295
Journal Issue
1
Journal Page Range
p. 585-594.
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
Physics of electronic and atomic collisions.
Dates
Sep 1993.
Place
Aarus (Denmark).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
26035367
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ARGON IONS; ELECTRON CAPTURE; ENERGY DEPENDENCE; HELIUM; IMPACT PARAMETER; ION-ATOM COLLISIONS; IONIZATION; KEV RANGE; MULTICHARGED IONS; OXYGEN IONS
Descriptors DEC
ATOM COLLISIONS; CAPTURE; CHARGED PARTICLES; COLLISIONS; ELEMENTS; ENERGY RANGE; ION COLLISIONS; IONS; NONMETALS; RARE GASES

Optional Information

Secondary number(s)
CONF-9309229--.