Published May 15, 2011 | Version v1
Journal article Metadata-only

Organic/inorganic nanocomposite films based on poly(3-methoxythiophene) and WO3

Creators

  • 1. Institute of Environmental Science and Engineering, Hangzhou Dinazi University, Hangzhou 310018 (China)
  • 2. Institute of Environmental Science and Engineering, Hangzhou Dinazi University, Hangzhou 310018 (China) and Department of Chemistry, Fujian Normal University, Fuzhou 350007 (China)
  • 3. College of Chemical Engineering and Materials Science, Zhejiang University of Technology, Hangzhou 310014 (China)
  • 4. Department of Chemistry, Fujian Normal University, Fuzhou 350007 (China)

Description

Organic/inorganic nanocomposite films based on poly(3-methoxythiophene) (PMOT) and WO3 were prepared by a consecutive two-step electrochemical method. The products were characterized in detail by scanning electron microscopy (SEM), energy-dispersive X-ray analysis (EDS) and Fourier-transform infrared spectroscopies (FTIR). The results show that the PMOT/WO3 nanocomposite films consist of two layers, the substrate WO3 with 30 nm grains and superstratum PMOT, which average grain size is 60 nm. The obtained PMOT/WO3 nanocomposite films were also characterized by cyclic voltammetry to investigate their electrochemistry properties which display significant enhancement of electrochemical activity than that of pure PMOT and WO3 films.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.mseb.2011.02.012

Additional details

Identifiers

DOI
10.1016/j.mseb.2011.02.012;
PII
S0921-5107(11)00080-8;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
176
Journal Issue
8
Journal Page Range
p. 684-687
ISSN
0921-5107
CODEN
MSBTEK

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43030627
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ELECTROCHEMISTRY; FILMS; FOURIER TRANSFORM SPECTROMETERS; FOURIER TRANSFORMATION; GRAIN SIZE; INFRARED SPECTRA; LAYERS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TUNGSTATES; TUNGSTEN OXIDES; VOLTAMETRY; X RADIATION
Descriptors DEC
CHALCOGENIDES; CHEMISTRY; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; INTEGRAL TRANSFORMATIONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; REFRACTORY METAL COMPOUNDS; SIZE; SPECTRA; SPECTROMETERS; TRANSFORMATIONS; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.