Published January 21, 2002 | Version v1
Journal article

Improved surface imaging with a near-field scanning microwave microscope using a tunable resonator

  • 1. Department of Physics, Sogang University, C.P.O. 1142, Seoul 121-742 (Korea, Republic of)

Description

We report a microwave surface imaging technique using a near-field scanning microwave microscope with a tunable resonance cavity. By tuning the resonance cavity, we could demonstrate improved sensitivity and spatial resolution of the topographic image of YBa2Cu3Oy thin films on MgO substrates. By measuring the shift of resonant frequency and the change of quality factor, we obtained near-field scanning microwave images with a spatial resolution better than 4 μm at an operating frequency of f=1-1.5 GHz. The principal of operation could be explained by the perturbation theory of a coaxial resonant cavity, considering the radius of the probe tip, the sample-tip distance, and the impedance matching

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
80
Journal Issue
3
Journal Page Range
p. 524-526
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2002 American Institute of Physics.