Effect of thermal treatment on microstructure in high pressure torsion (HPT) deformed nickel
Creators
Description
Polycrystalline 99.9% Ni has been deformed at room temperature to equivalent strains of about 55 by high pressure torsion (HPT) deformation under a hydrostatic pressure of about 7 GPa. After annealing at different temperatures the structural element (grain/subgrain, scattering domain) size was determined by using scanning electron microscopy and multiple X-ray Bragg profile analysis in order to draw a correlation to the strength evolution obtained by microhardness measurements. There has to be differentiated with respect to the occurring characters of the microstructure--the as-deformed and recovered microstructure, respectively, and the structure resulting after recrystallisation. The strength is directly correlated to the grain size and decreases when the grain size starts to increase at homologous temperatures above 0.4Tm. The recovery of the very high dislocation density is shifted to low temperatures starting even at 0.2Tm and has primarily no effect on the strength
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2004.01.112;
- PII
- S0921509304006689;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 387-389
- Journal Issue
- 2-3
- Journal Page Range
- p. 799-804
- ISSN
- 0921-5093
- CODEN
- MSAPE3
Conference
- Title
- 13. international conference on the strength of materials
- Dates
- 25-30 Aug 2003
- Place
- Budapest (Hungary)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38064229
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; DEFORMATION; DISLOCATIONS; GRAIN SIZE; MICROHARDNESS; NANOSTRUCTURES; NICKEL; PLASTICITY; POLYCRYSTALS; PRESSURE RANGE GIGA PA; RECRYSTALLIZATION; SCANNING ELECTRON MICROSCOPY; STRAINS; TEMPERATURE RANGE 0273-0400 K; TORSION; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; HARDNESS; HEAT TREATMENTS; IONIZING RADIATIONS; LINE DEFECTS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; MICROSTRUCTURE; PRESSURE RANGE; RADIATIONS; SCATTERING; SIZE; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.