Published June 1, 2007 | Version v1
Journal article

Lattice and beam optics design for suppression of CSR-induced emittance growth at the KEK-ERL test facility

  • 1. KEK, High Energy Accelerator Research Organization, Oho 1-1, Tsukuba, Ibaraki 305-0801 (Japan)

Description

The lattice and beam optics of the arc section of the KEK-ERL test facility, having an energy of 200 MeV, were optimized to efficiently suppress emittance growth based on a simulation using a particle-tracking method taking coherent synchrotron radiation effects into account. The lattice optimization in the arc section was performed under two conditions: a high-current mode with a bunch charge of 76.9 pC without bunch compression, and a short-bunch mode with bunch compression, producing a final bunch length of around 0.1 ps. The simulation results showed that, in the high-current mode, emittance growth was efficiently suppressed by keeping a root-mean-square (rms) bunch length of 1 ps at a bunch charge of 76.9 pC, and in the short-bunch mode, emittance growth was kept within permissible limits with a maximum allowable bunch charge of 23.1 pC at an rms bunch length of 0.1 ps

Additional details

Identifiers

DOI
10.1016/j.nima.2007.02.095;
PII
S0168-9002(07)00450-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
575
Journal Issue
3
Journal Page Range
p. 315-320
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38106401
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
BEAM OPTICS; DESIGN; JAPANESE ORGANIZATIONS; LENGTH; LIGHT SOURCES; LINEAR ACCELERATORS; MEV RANGE; OPTIMIZATION; SIMULATION; SYNCHROTRON RADIATION; TEST FACILITIES
Descriptors DEC
ACCELERATORS; BREMSSTRAHLUNG; DIMENSIONS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; NATIONAL ORGANIZATIONS; RADIATION SOURCES; RADIATIONS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.