Published June 27, 2015 | Version v1
Journal article Metadata-only

Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

Creators

  • 1. Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, D-22607 Hamburg (Germany)
  • 2. Ankara University, Ankara 06100 (Turkey)
  • 3. Technische Universität Dortmund, Dortmund (Germany)
  • 4. Lund University, SE-22100 Lund (Sweden)
  • 5. Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States)

Description

A high-energy-resolution spectrometer featuring a quartz crystal analyzer is presented. The manuscript includes a step-by-step recipe for manufacturing the analyzer and a detailed ray-tracing analysis. An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal

Availability note (English)

Available from http://dx.doi.org/10.1107/S1600577515009686; Available from http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787028

Additional details

Identifiers

URL
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4787028;
DOI
10.1107/S1600577515009686;
PII
S1600577515009686;

Publishing Information

Journal Title
Journal of Synchrotron Radiation
Journal Volume
22
Journal Issue
Pt 4
Journal Page Range
p. 961-967
ISSN
0909-0495
CODEN
JSYRES

INIS

Country of Publication
Denmark
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47089166
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
MEV RANGE 10-100; MONOCRYSTALS; QUARTZ; SILICON OXIDES; SPECTROMETERS; X-RAY DIFFRACTION
Descriptors DEC
CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ENERGY RANGE; MEASURING INSTRUMENTS; MEV RANGE; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) Didem Ketenoglu et al. 2015
Notes
PMCID: PMC4787028; PMID: 26134800; PUBLISHER-ID: hf5287; OAI: oai:pubmedcentral.nih.gov:4787028; This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.