Synchrotron radiation and neutron properties: the use of these different radiations for the study the structure of materials
Creators
- 1. University of Canberra, ACT (Australia). Faculty of Information Science and Engineering
Description
Full text: A brief description of synchrotron radiation and neutron emission will be presented. For synchrotrons, a comparison of the emission of x rays from bending magnets, wigglers and undulators will be given. The generation of neutrons in reactors and spallation sources will be briefly discussed. The very different, one might say complementary, properties of these radiations make them suitable for use together for the solution of the structure of materials. In particular, the talk will cover: the use of anomalous diffraction techniques for structure determination in powder diffraction (multiple (wavelength) anomalous diffraction (MAD) and diffraction anomalous fine structure (DAFS); x ray absorption fine structure (XAFS) close to the critical angle of reflection and the link to total reflection x ray fluorescence analysis (TXRF); and the use of x-rays and neutrons for the study of surfaces and interfaces using reflectometer techniques. Copyright (1999) Australian X-ray Analytical Association Inc
Additional details
Publishing Information
- Imprint Title
- The 11th National School and Conference of the Australian X-ray Analytical Association on Analytical X-ray for Industry and Science
- Imprint Pagination
- 210 p.
- Journal Page Range
- p. 44
Conference
- Title
- AXAA99. Analytical X-ray for Industry and Science
- Dates
- 8-12 Feb 1999
- Place
- Melbourne, VIC (Australia)
INIS
- Country of Publication
- Australia
- Country of Input or Organization
- Australia
- INIS RN
- 30048816
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; CRYSTAL STRUCTURE; DATA ANALYSIS; FINE STRUCTURE; INTERFACES; MATERIALS TESTING; NEUTRON EMISSION; SPECTRAL REFLECTANCE; SURFACES; SYNCHROTRON RADIATION; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SOURCES
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; EMISSION; NONDESTRUCTIVE ANALYSIS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; SCATTERING; SORPTION; TESTING; X-RAY EMISSION ANALYSIS