Effect of Ti:ZnO Layer on the Phase Transition and the Optical Properties of VO2 Film
Creators
- 1. Pohang University of Science and Technology (POSTECH), Pohang Accelerator Laboratory (Korea, Republic of)
Description
VO2 single-layer and VO2/Ti:ZnO bilayer thin film samples were stabilized on quartz substrates by using sputtering technique, and their structural, morphological and optical properties were investigated. The X-ray diffraction (XRD) results confirmed that VO2 stabilized in the mono-clinic structure in both the samples. Temperature-dependent XRD results demonstrated that the monoclinic-to-rutile structural phase transition temperature had shifted in bilayer sample as compared to VO2 single-layer sample. A uniform surface morphology was realized in both samples, as shown by atomic force microscopy. UV-vis spectroscopy results revealed a significant improvement in the optical transmission in the VO2/Ti:ZnO bilayer thin-film sample. Improved visible transmittance of bilayer sample identifies it as a good candidate for smart window applications.
Additional details
Identifiers
- DOI
- 10.3938/jkps.75.519;
Publishing Information
- Journal Title
- Journal of the Korean Physical Society
- Journal Volume
- 75
- Journal Issue
- 7
- Journal Page Range
- p. 519-522
- ISSN
- 0374-4884
- CODEN
- KPSJAS
Conference
- Title
- 15. international surface X-ray and neutron scattering conference
- Acronym
- SXNS-15
- Dates
- 15-19 Jul 2018
- Place
- Pohang (Korea, Republic of)
INIS
- Country of Publication
- Korea, Republic of
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54085402
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; LAYERS; MONOCLINIC LATTICES; MORPHOLOGY; OPTICAL PROPERTIES; PHASE TRANSFORMATIONS; QUARTZ; RUTILE; SPECTROSCOPY; SUBSTRATES; SURFACES; TEMPERATURE DEPENDENCE; THIN FILMS; TRANSITION TEMPERATURE; VANADIUM OXIDES; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; FILMS; MATERIALS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIOACTIVE MATERIALS; RADIOACTIVE MINERALS; SCATTERING; THERMODYNAMIC PROPERTIES; THREE-DIMENSIONAL LATTICES; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2019 The Korean Physical Society