Published October 2019 | Version v1
Journal article

Effect of Ti:ZnO Layer on the Phase Transition and the Optical Properties of VO2 Film

  • 1. Pohang University of Science and Technology (POSTECH), Pohang Accelerator Laboratory (Korea, Republic of)

Description

VO2 single-layer and VO2/Ti:ZnO bilayer thin film samples were stabilized on quartz substrates by using sputtering technique, and their structural, morphological and optical properties were investigated. The X-ray diffraction (XRD) results confirmed that VO2 stabilized in the mono-clinic structure in both the samples. Temperature-dependent XRD results demonstrated that the monoclinic-to-rutile structural phase transition temperature had shifted in bilayer sample as compared to VO2 single-layer sample. A uniform surface morphology was realized in both samples, as shown by atomic force microscopy. UV-vis spectroscopy results revealed a significant improvement in the optical transmission in the VO2/Ti:ZnO bilayer thin-film sample. Improved visible transmittance of bilayer sample identifies it as a good candidate for smart window applications.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of the Korean Physical Society
Journal Volume
75
Journal Issue
7
Journal Page Range
p. 519-522
ISSN
0374-4884
CODEN
KPSJAS

Conference

Title
15. international surface X-ray and neutron scattering conference
Acronym
SXNS-15
Dates
15-19 Jul 2018
Place
Pohang (Korea, Republic of)

Optional Information

Copyright
Copyright (c) 2019 The Korean Physical Society