Published 1983 | Version v1
Journal article

Study on the implantation of recoil atoms in semiconductor substrate

Description

The kinetic model of amotic cascade propagation in sandwich-type structures have been developed by the authors recently. Predictions of the model are being compared with the related experimental data. Concentration profile of Ni recoil implanted into silicon substrate at great dephs (x > 400 A) is well described by the model. Possible modifications of the model for shallow depths are being discussed

Additional details

Additional titles

Original title (Russian)
Изучение процессов внедрения атомов отдачи в полупроводниковую подложку

Publishing Information

Journal Title
Probl. Yad. Fiz. Kosm. Luchej
Journal Issue
no.19
Series
Probl. Yad. Fiz. Kosm. Luchej.
CODEN
PIFLD