Measurements of charging-up processes in THGEM-based particle detectors
Creators
- 1. Department of Astrophysics and Particle Physics, Weizmann Institute of Science, P.O. Box 26, Rehovot 76100 (Israel)
- 2. I3N— Physics Department, University of Aveiro, Campus Universit/' ario de Santiago 3810-193, Aveiro (Portugal)
Description
The time-dependent gain variation of detectors incorporating Thick Gas Electron Multipliers (THGEM) electrodes was studied in the context of charging-up processes of the electrode's insulating surfaces. An experimental study was performed to examine model-simulation results of the aforementioned phenomena, under various experimental conditions. The results indicate that in a stable detector's environment, the gain stabilization process is mainly affected by the charging-up of the detector's insulating surfaces caused by the avalanche charges. The charging-up is a transient effect, occurring during the detector's initial operation period; it does not affect its long-term operation. The experimental results are consistent with the outcome of model-simulations.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/13/03/P03009Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 13
- Journal Issue
- 03
- Journal Page Range
- p. P03009
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51062711
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; ELECTRON MULTIPLIERS; RADIATION DETECTORS; TIME DEPENDENCE; TRANSIENTS
- Descriptors DEC
- ELECTRON TUBES; MEASURING INSTRUMENTS; SIMULATION