Published March 1, 2018 | Version v1
Journal article

Measurements of charging-up processes in THGEM-based particle detectors

  • 1. Department of Astrophysics and Particle Physics, Weizmann Institute of Science, P.O. Box 26, Rehovot 76100 (Israel)
  • 2. I3N— Physics Department, University of Aveiro, Campus Universit/' ario de Santiago 3810-193, Aveiro (Portugal)

Description

The time-dependent gain variation of detectors incorporating Thick Gas Electron Multipliers (THGEM) electrodes was studied in the context of charging-up processes of the electrode's insulating surfaces. An experimental study was performed to examine model-simulation results of the aforementioned phenomena, under various experimental conditions. The results indicate that in a stable detector's environment, the gain stabilization process is mainly affected by the charging-up of the detector's insulating surfaces caused by the avalanche charges. The charging-up is a transient effect, occurring during the detector's initial operation period; it does not affect its long-term operation. The experimental results are consistent with the outcome of model-simulations.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/13/03/P03009

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
13
Journal Issue
03
Journal Page Range
p. P03009
ISSN
1748-0221

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51062711
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPUTERIZED SIMULATION; ELECTRON MULTIPLIERS; RADIATION DETECTORS; TIME DEPENDENCE; TRANSIENTS
Descriptors DEC
ELECTRON TUBES; MEASURING INSTRUMENTS; SIMULATION