Published January 1988
| Version v1
Journal article
Stabilization and calibration of hodoscopic Cerenkov spectrometer
Description
A procedure is described for stabilization and monitoring of the parameter drift of a 70-channel Cerenkov spectrometer by analysis of reference signals generated by a nitrogen laser. All reference signals are locked onto the light flash from an alpha source implemented by a single reference element. A complete cycle of collection of stabilizing parameters together with their high-speed computer processing is performed in ∼ 1 min during an experiment. Drift of the photomultiplier supply by hundreds of volts and variation of laser power by a factor of 2-3 cause a change of ≤ 2% in the calculated energy
Additional details
Publishing Information
- Journal Title
- Instruments and Experimental Techniques (English Translation)
- Journal Volume
- 30
- Journal Issue
- 4
- Series
- Instrum. Exp. Tech. (Engl. Transl.).
- Journal Page Range
- 793-797
- ISSN
- 0020-4412
- CODEN
- INETA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 20003981
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Translation
- Descriptors DEI
- BREMSSTRAHLUNG; CALIBRATION; CASCADE SHOWERS; CHERENKOV COUNTERS; CHERENKOV RADIATION; DATA ACQUISITION SYSTEMS; ELECTRONS; ENERGY RESOLUTION; EREVAN SYNCHROTRON; GAS LASERS; HODOSCOPES; LIGHT SOURCES; ON-LINE CONTROL SYSTEMS; PERFORMANCE; PERFORMANCE TESTING; PHOTOMULTIPLIERS; PHOTONS; SHOWER COUNTERS; SPECTROMETERS; STABILITY
- Descriptors DEC
- ACCELERATORS; AMPLIFIERS; BOSONS; CONTROL SYSTEMS; CYCLIC ACCELERATORS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; LASERS; LEPTONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; ON-LINE SYSTEMS; PHOTOTUBES; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; RESOLUTION; SHOWERS; SYNCHROTRONS; TESTING
Optional Information
- Notes
- Translated from Prib. Tekh. Eksp.; 30: No. 4, 40-43(Jul-Aug 1987).