Published 1986 | Version v1
Book Metadata-only

X-ray structural diagnostics for investigation of monocrystal near surface layers

Creators

Description

Main conceptions on X-ray diffraction physics aimed at creating methods for crystal structure analysis of thin presurface layers and crystal interphases of high degree of perfection, and firstly of semiconductor crystals being the basis for modern microelectronics, are presented

Additional details

Additional titles

Original title (Russian)
Рентгеновская структурная диагностика в исследовании приповерхностных слоев монокристаллов

Publishing Information

Publisher
Nauka.
Imprint Place
Moscow (USSR)
Imprint Pagination
96 p.

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
18011055
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
AMORPHOUS STATE; BRAGG REFLECTION; CRYSTAL STRUCTURE; INTERFACES; MONOCRYSTALS; PHOTOELECTRIC EMISSION; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; STANDING WAVES; SURFACES; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON EMISSION; EMISSION; MATERIALS; OPTICAL PROPERTIES; PHOTOELECTRIC EFFECT; PHYSICAL PROPERTIES; REFLECTION; SCATTERING

Optional Information

Notes
25 refs.; 36 figs.