Published November 1, 2010
| Version v1
Journal article
Phase-sensitive reflectometer using a single-frequency laser diode and an Er-doped fibre amplifier
Creators
Description
We report on the observation of phase-sensitive Rayleigh backscattering from a single-mode fiber excited by light pulses obtained from a highly coherent single-frequency laser diode and an Erbium doped fiber amplifier (EDFA). The laser diode stability was tested using a highly imbalanced fiber optic Mach-Zehnder interferometer. The CW laser light was first modulated using fiber-optic EO modulator which formed 100ns to 500 ns pulses that correspond to 20 to 100 m of pulse length in the fiber. The backscattered light power is estimated to be about -51 dB lower than the launched power at the input and about N=500 averages are needed for a sensing length of Ls 40 km to be in the useful dynamic range.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/253/1/012018Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 253
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1742-6596
Conference
- Title
- 16. international school on condensed matter physics - Progress in solid state and molecular electronics, ionics and photonics
- Acronym
- 16 ISCMP
- Dates
- 29 Aug - 3 Sep 2010
- Place
- Varna (Bulgaria)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42053632
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMPLIFIERS; BACKSCATTERING; DOPED MATERIALS; ERBIUM ADDITIONS; FIBERS; LASER RADIATION; MACH-ZEHNDER INTERFEROMETER; PULSES; RAYLEIGH SCATTERING; SEMICONDUCTOR LASERS; STABILITY
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; ERBIUM ALLOYS; INTERFEROMETERS; LASERS; MATERIALS; MEASURING INSTRUMENTS; RADIATIONS; RARE EARTH ADDITIONS; RARE EARTH ALLOYS; SCATTERING; SEMICONDUCTOR DEVICES; SOLID STATE LASERS