Field effect properties of single-layer MoS2(1−x)Se2x nanosheets produced by a one-step CVD process
Creators
- 1. Tianjin University of Technology, School of Electrical and Electronic Engineering, Tianjin Key Laboratory of Film Electronic and Communication Devices (China)
- 2. Peking University, Institute of Microelectronics (China)
- 3. Tsinghua University, Tsinghua National Laboratory for Information Science and Technology, Institute of Microelectronics (China)
Description
In recent years, interfacial doping with other atoms, molecules, and nanoparticles in molybdenum disulfide (MoS2) has been proven as a new route to explore the potential application of 2D materials in microelectronical devices. In this paper, we utilized a one-step chemical vapor deposition approach to synthesize monolayer MoS2(1−x)Se2x nanosheets in atmospheric pressure using MoO3, S, and Se powders as precursors. AFM and visible-light microscopy showed that the as-grown nanosheets were single layers, their surface was atomic flat, and the maximum grain size was over 100 μm. XPS characterization demonstrated that the concentration of selenium in MoS2(1−x)Se2x nanosheets was affected by the amount of selenium powder in the doping process. The back-gate FETs were fabricated to investigate the electrical properties of monolayer MoS2(1−x)Se2x nanosheets with different Se contents. The field effect properties of MoS2(1−x)Se2x (x = 0.65) transistors indicated that a moderate mobility was achieved, and ohmic contact was obtained at the interface of the MoS2(1−x)Se2x channel and metal electrodes. Characterization using high-resolution transmission electron microscopy showed that the microstructure of as-grown MoS2(1−x)Se2x (x = 0.65) had a regular hexagonal lattice structure, which revealed that it was a single-crystalline two-dimensional material.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science
- Journal Volume
- 53
- Journal Issue
- 20
- Journal Page Range
- p. 14447-14455
- ISSN
- 0022-2461
- CODEN
- JMTSAS
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49105049
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATMOSPHERIC PRESSURE; ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; DOPED MATERIALS; ELECTRICAL PROPERTIES; GRAIN SIZE; HEXAGONAL LATTICES; MOLYBDENUM OXIDES; MOLYBDENUM SULFIDES; NANOSTRUCTURES; SHEETS; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY; TWO-DIMENSIONAL SYSTEMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL COATING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DEPOSITION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; MATERIALS; MICROSCOPY; MICROSTRUCTURE; MOLYBDENUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SIZE; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING; THREE-DIMENSIONAL LATTICES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2018 Springer Science+Business Media, LLC, part of Springer Nature
- Notes
- http://www.springer-ny.com