Silica-supported silver nanoparticles: Tailoring of structure-property relationships
Creators
- 1. Department of Materials Engineering and Industrial Technologies, Trento University, Via Mesiano, 77-38050 Trento (Italy)
- 2. Department of Chemical Sciences, Padova University and Consorzio Interuniversitario Nazionale per la Scienza e Tecnologia dei Materiali (INSTM), Via Marzolo, 1-35131 Padova (Italy)
- 3. Instituto di Scienze e Tecnologie Molecolari-Consiglio Nazionale delle Richerche (ISTM-CNR) and Consorzio Interuniversitario Nazionale per la Scienza e Tecnologia dei Materiali (INSTM), Department of Chemical Sciences, Padova University, Via Marzolo, 1-35131 Padova (Italy)
Description
Silica-supported silver nanoparticles were obtained by rf sputtering from Ar plasmas under soft synthesis conditions, with particular attention to the combined influence of rf power and total pressure on the system composition, nanostructure, morphology, and optical properties. In order to attain a thorough insight into the nucleation and growth phenomena of Ag nanoparticles on the silica substrate, several in situ and ex situ characterization techniques were used. In particular, a laser reflection interferometry system was employed for a real-time monitoring of the deposition process, providing useful and complementary information with respect to the other ex situ techniques (x-ray photoelectron spectroscopy and x-ray excited Auger electron spectroscopy, glancing incidence x-ray diffraction, atomic force microscopy, optical-absorption spectroscopy, and transmission electron microscopy). The above investigations evidenced the formation of silver-based nanosystems (average crystallite size ≤10 nm), whose features (metal content, Ag particle size and shape, structure and optical properties) could be carefully tailored by moderate and controlled variations of the synthesis parameters
Additional details
Identifiers
- DOI
- 10.1063/1.1856213;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 97
- Journal Issue
- 5
- Journal Page Range
- p. 054311-054311.8
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36106931
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CRYSTAL GROWTH; DEPOSITION; INTERFEROMETRY; MORPHOLOGY; NANOSTRUCTURES; NUCLEATION; OPTICAL PROPERTIES; PARTICLE SIZE; PARTICLES; SILICA; SILVER; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTRA; VISIBLE SPECTRA; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; METALS; MICROSCOPY; MINERALS; OXIDE MINERALS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SIZE; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2005 American Institute of Physics