Published September 2013
| Version v1
Journal article
Microstructure and deformation mechanisms in nanocrystalline Ni–Fe. Part II. In situ testing during X-ray diffraction
- 1. Materials Science and Simulations, NUM/ASQ, Paul Scherrer Institut, CH-5232 Villigen (Switzerland)
- 2. NXMM laboratory, IMX, Ecole Polytechnique Fédéral de Lausanne, CH-1015 Lausanne (Switzerland)
Description
Deformation mechanisms in nanocrystalline electrodeposited Ni (26 nm) and Ni–Fe (12 nm) are studied by strain rate sensitivity experiments and in situ mechanical testing during X-ray diffraction. We find a relatively low strength for Ni–Fe, which may be ascribed to a weakening of dislocation pinning points. Furthermore, the strain rate sensitivity of Ni–Fe is relatively low. The in situ studies allow the macroscopic mechanical response of Ni to be divided into three different deformation regimes: elastic, microplastic and macroplastic. For Ni–Fe, recovery mechanisms seem particularly important, resulting in an extended microplastic regime and necking before a state of homogeneous deformation can be reached
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2013.06.029Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2013.06.029;
- PII
- S1359-6454(13)00461-8;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 61
- Journal Issue
- 15
- Journal Page Range
- p. 5846-5856
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45038022
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTALS; DEFORMATION; DISLOCATION PINNING; ELECTRODEPOSITION; MECHANICAL PROPERTIES; MICROSTRUCTURE; NANOSTRUCTURES; SENSITIVITY; STRAIN RATE; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROLYSIS; LYSIS; SCATTERING; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.