Si(111)2x2-Fe surface reacted with nitric oxide
Description
We have studied a Si(111)2x2-Fe surface exposed to nitric oxide at room temperature with Auger electron spectroscopy, low-energy electron diffraction, and scanning tunneling microscopy (STM). The surface local structure of Si(111)2x2-Fe has been modeled to be similar to that of Si(111)7x7; both structures have Si adatom and Si first-layer restatom, but the restatom in the former surface bonds to Fe atoms. It is known that NO molecules dissociatively adsorb on Si(111)7x7 surface, especially atop adatoms. Before the exposure to the Si(111)2x2-Fe surface, STM images showed 2x2 islands on the 2x2 terrace. After the exposure, the 2x2 islands were eroded at the island edge while the 2x2 terrace was stable against nitric oxide. We ascribed the inert property of the 2x2 terrace, and the reactive property of the 2x2 island edges and the 7x7 terrace, primarily to the Si restatom with different neighbor atoms
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2004.06.050;
- PII
- S0040609004007904;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 464-465
- Journal Issue
- 1-2
- Journal Page Range
- p. 5-9
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 7. international symposium on atomically controlled surfaces, interfaces and nanostructures
- Dates
- 16-20 Nov 2003
- Place
- Nara (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36079134
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; CHEMICAL REACTIONS; ELECTRON DIFFRACTION; IRON; IRON COMPOUNDS; LAYERS; NITRIC OXIDE; SCANNING TUNNELING MICROSCOPY; SILICON; SILICON COMPOUNDS; SURFACES; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTS; METALS; MICROSCOPY; NITROGEN COMPOUNDS; NITROGEN OXIDES; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SEMIMETALS; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.