Studies on the nuclear tracks in CR-39 plastics
Creators
Description
A review was given for our recent studies on the latent tracks in CR-39 nuclear track detector. The radial size of track core has been determined through UV spectral measurements combined to the model of track overlapping and by AFM observations of slightly etched detectors. The track core radius was found to be about a few nano-meters and almost proportional to the cubic root of stopping power. As a control study, the etching properties of CR-39, irradiated by low-LET radiation, has been examined. The observed depth dependence and dose-rate dependence of the bulk etch rate of the irradiated CR-39 were explained that the damage formation process was governed by the reaction between the radiation induced radicals and the oxygen supplied from the air. This indicated that latent tracks in CR-39 are produced through local radiation induced oxidation process along the ion paths. Studies on vibration spectra, near-IR, FT-IR and Raman spectra, of CR-39 have also been carried out to estimate the chemical structure of the latent tracks. The creation of OH group in irradiated CR-39 has been confirmed
Additional details
Identifiers
- DOI
- 10.1016/S1350-4487(03)00099-4;
- arXiv
- arXiv:math/9704221v1;
- PII
- S1350448703000994;
Publishing Information
- Journal Title
- Radiation Measurements
- Journal Volume
- 36
- Journal Issue
- 1-6
- Journal Page Range
- p. 73-81
- ISSN
- 1350-4487
- CODEN
- RMEAEP
Conference
- Title
- 21. international conference on nuclear tracks in solids
- Dates
- 21-25 Oct 2003
- Place
- New Delhi (India)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35033254
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; DIELECTRIC TRACK DETECTORS; ETCHING; HYDROXYL RADICALS; MICROSTRUCTURE; PARTICLE TRACKS; PHYSICAL RADIATION EFFECTS; PLASTICS; RAMAN SPECTRA
- Descriptors DEC
- HEAT TREATMENTS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; POLYMERS; RADIATION DETECTORS; RADIATION EFFECTS; RADICALS; SPECTRA; SURFACE FINISHING; SYNTHETIC MATERIALS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.