Terahertz-bandwidth pulses for coherent time-domain spectroscopy
Creators
- 1. Univ. of Michigan, Ann Arbor, MI (United States). Center for Ultrafast Optical Science
Description
Ultrashort pulses of electromagnetic radiation propagating through free space are used to perform coherent time-domain spectroscopy by probing the complex index of refraction of various materials, in particular thin films of high-critical-temperature superconductors and the microwave substrates the support them. The terahertz beam system utilizes Hertz ian-dipole-like antennas consisting of a dc-biased photoconductive gap in a coplanar stripline as a transmitter, and an identical receiver with a photoconductive gap biased by the THz radiation. The transmitter is driven to produce the short radiation bursts by a 100-fs optical pulse from a Ti:sapphire self-mode-locked laser, while the receiver is synchronously gated by laser pulses split from the original beam. By performing measurements in the time domain and transforming data to the frequency domain, both the real and imaginary parts of the index of refraction of dielectrics and the conductivity of superconductors are determined over the entire range from ∼200 GHz to several terahertz. This technique allows the direct broadband determination of these quantities in the millimeter-wave and submillimeter-wave regimes from the measurement of only a few time-domain waveforms and without the need for Kramers-Kroenig analysis or complicated processing
Additional details
Publishing Information
- Publisher
- SPIE--The International Society for Optical Engineering.
- Imprint Place
- Bellingham, WA (United States)
- ISBN
- 0-8194-1440-9
- Imprint Title
- Nonlinear optics for high-speed electronics and optical frequency conversion. Proceedings, SPIE Volume 2145
- Imprint Pagination
- 366 p.
- Journal Page Range
- p. 168-177.
Conference
- Title
- conference on optics, electro-optics, and laser applications in science and engineering.
- Acronym
- OE/LASE '94
- Dates
- 22-29 Jan 1994.
- Place
- Los Angeles, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27004549
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ALUMINIUM OXIDES; BARIUM OXIDES; BISMUTH OXIDES; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; FAR INFRARED RADIATION; FOURIER TRANSFORM SPECTROMETERS; HIGH-TC SUPERCONDUCTORS; LANTHANUM OXIDES; MICROWAVE RADIATION; PENETRATION DEPTH; PHYSICAL PROPERTIES; POTASSIUM OXIDES; SPECTROSCOPY; SUBSTRATES; ZIRCONIUM OXIDES
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; BARIUM COMPOUNDS; BISMUTH COMPOUNDS; CHALCOGENIDES; DATA; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; INFORMATION; INFRARED RADIATION; LANTHANUM COMPOUNDS; MEASURING INSTRUMENTS; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; POTASSIUM COMPOUNDS; RADIATIONS; RARE EARTH COMPOUNDS; SPECTROMETERS; SUPERCONDUCTORS; TRANSITION ELEMENT COMPOUNDS; ZIRCONIUM COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-940142--.