Published June 1983 | Version v1
Report Metadata-only

Beta backscattering instruments for coating thickness measurements in electronic and electrotechnical industry

Creators

  • 1. Plovdivski Univ. (Bulgaria)

Description

Two models of beta backscattering gages are described for thickness measurements of metallic or non-metallic coatings applied in electronic and electrotechnical industry and various combinations of coatings and substrates in a wide range of thickness. The gages show high resolution and appropriate accuracy. In order to increase the measurement capability one model was fitted with a microprocessor. The most important additional features of this model are given including the electronic unit and the program algorithm

Additional details

Publishing Information

Imprint Title
Radioisotope application and radiation processing in industry
Imprint Pagination
480 p.
Journal Page Range
p. 215-223.
Report number
ZfI-Mitt--69

Conference

Title
2. working meeting 'radioisotope application and radiation processing in industry'.
Dates
28 Sep - 1 Oct 1982.
Place
Leipzig (German Democratic Republic).

INIS

Country of Publication
German Democratic Republic
Country of Input or Organization
German Democratic Republic
INIS RN
14806798
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; ALGORITHMS; COATINGS; COUNTING CIRCUITS; MICROPROCESSORS; PROMETHIUM 147; RADIOMETRIC GAGES; THALLIUM 204; THICKNESS GAGES
Descriptors DEC
BETA DECAY RADIOISOTOPES; BETA-MINUS DECAY RADIOISOTOPES; ELECTRONIC CIRCUITS; HEAVY NUCLEI; INTERMEDIATE MASS NUCLEI; ISOTOPES; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; NUCLEI; ODD-EVEN NUCLEI; ODD-ODD NUCLEI; PROMETHIUM ISOTOPES; RADIOISOTOPES; RARE EARTH NUCLEI; THALLIUM ISOTOPES; YEARS LIVING RADIOISOTOPES