Microwave characteristics of sol-gel based Ag-doped (Ba0.6Sr0.4)TiO3 thin films
- 1. Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL 32611 (United States)
- 2. Department of Electrical and Electronic Engineering, Universidad Tecnológica de Bolívar Cartagena, 130011 Colombia (Colombia)
- 3. Packaging Research Center, Korea Electronics Technology Institute, Gyeonggi-do, 463-816 (Korea, Republic of)
Description
Dielectric Ba0.6Sr0.4TiO3 (BST) thin films with a different concentration of Ag-dopant of 0.5, 1, 1.5, 2, 3, and 5 mol % have been prepared using an alkoxide-based sol-gel method on a Pt(111)/TiO2/SiO2/Si substrate and their surface morphology and crystallinity have been examined using scanning electron microscopy (SEM) and X-ray diffraction (XRD) analysis, respectively. An on-chip metal-insulator-metal capacitor has been fabricated with the prepared thin film ferroelectric sample. Concentric coplanar electrodes are used for high frequency electrical characterization with a vector network analyzer and a probe station. The SEM images show that increasing Ag doping concentration leads to a decrease in grain size. XRD reveals that the fabricated films show good BST crystallinity for all the concentration while a doping concentration of 5 mol % starts to show an Ag peak, implying a metallic phase. Improved microwave dielectric loss properties of the BST thin films are observed in a low Ag doping level. Especially, BST with an Ag doping concentration of 1 mol % shows the best properties with a dielectric constant of 269.3, a quality factor of 48.1, a tunability at the electric field of 100 kV/cm of 41.2 %, a leakage-current density of 1.045 × 10−7A/cm2 at an electric field of 100 kV/cm and a figure of merit (defined by tunability (%) divided by tan δ (%)) of 19.59 under a dc bias voltage of 10 V at 1 GHz. - Highlights: • High quality Ag-doped Ba0.6Sr0.4TiO3 (BST) thin films were derived by the sol-gel method. • Doped Ag replaced the A site ions in the ABO3 type structure. • Doped Ag helped lower leakage current by filling oxygen vacancies, which is a leakage path. • Microwave characteristics of low dielectric loss and good tunability were confirmed. • Great potential is envisioned for low loss tunable microwave applications
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2014.06.047Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2014.06.047;
- PII
- S0040-6090(14)00711-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 565
- Journal Page Range
- p. 172-178
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47004161
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BARIUM COMPOUNDS; CONCENTRATION RATIO; DEPOSITION; DOPED MATERIALS; ELECTRIC FIELDS; FERROELECTRIC MATERIALS; GHZ RANGE; GRAIN SIZE; LEAKAGE CURRENT; MICROWAVE RADIATION; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SILICON OXIDES; SILVER; SOL-GEL PROCESS; STRONTIUM TITANATES; THIN FILMS; VACANCIES; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CURRENTS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; FREQUENCY RANGE; MATERIALS; METALS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POINT DEFECTS; RADIATIONS; SCATTERING; SILICON COMPOUNDS; SIZE; STRONTIUM COMPOUNDS; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.