Published January 2008 | Version v1
Journal article

Wavelet spectrum analysis for bearing fault diagnostics

  • 1. Department of Mechanical and Mechatronics Engineering, University of Waterloo, Waterloo, ON, N2L 3G1 (Canada)
  • 2. Department of Mechanical Engineering, Lakehead University, Thunder Bay, ON, P7B 5E1 (Canada)

Description

A new signal processing technique, wavelet spectrum analysis, is proposed in this paper for incipient bearing fault diagnostics. This technique starts from investigating the resonance signatures over selected frequency bands to extract the representative features. A novel strategy is suggested for the deployment of the wavelet centre frequencies. A weighted Shannon function is proposed to synthesize the wavelet coefficient functions to enhance feature characteristics, whereas the applied weights are from a statistical index that quantifies the effect of different wavelet centre frequencies on feature extraction. An averaged autocorrelation spectrum is adopted to highlight the feature characteristics related to bearing health conditions. The performance of this proposed technique is examined by a series of experimental tests corresponding to different bearing conditions. Test results show that this new signal processing technique is an effective bearing fault detection method, which is especially useful for non-stationary feature extraction and analysis

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/19/1/015105

Additional details

Identifiers

DOI
10.1088/0957-0233/19/1/015105;
PII
S0957-0233(08)57678-8;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
19
Journal Issue
1
Journal Page Range
[9 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44106388
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
BEARINGS; EXTRACTION; FAULT TREE ANALYSIS; RESONANCE; SIGNALS; SPECTRA
Descriptors DEC
SEPARATION PROCESSES; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS