Published June 2013 | Version v1
Journal article

Vortex ratchet induced by controlled edge roughness

  • 1. INPAC—Institute for Nanoscale Physics and Chemistry, KU Leuven, Celestijnenlaan 200D, B-3001 Leuven (Belgium)
  • 2. Department of Applied Physics, Chalmers University of Technology, SE-412 96 Göteborg (Sweden)
  • 3. TQC—Theory of Quantum and Complex Systems, Universiteit Antwerpen, Universiteitsplein 1, B-2610 Antwerpen (Belgium)
  • 4. Département de Physique, Université de Liège, Allée du 6 août 17, Bat. B5a, B-4000 Sart Tilman (Belgium)

Description

We demonstrate theoretically and experimentally the generation of rectified mean vortex displacement resulting from a controlled difference between the surface barriers at the opposite borders of a superconducting strip. Our investigation focuses on Al superconducting strips where, in one of the two sample borders, a saw tooth-like array of micro-indentations has been imprinted. The origin of the vortex ratchet effect is based on the fact that (i) the onset of vortex motion is mainly governed by the entrance/nucleation of vortices and (ii) the current lines bunching produced by the indentations facilitates the entrance/nucleation of vortices. Only for one current direction the indentations are positioned at the side of vortex entry and the onset of the resistive regime is lowered compared to the opposite current direction. This investigation points to the relevance of ubiquitous border effects typically neglected when interpreting vortex ratchet measurements on samples with arrays of local asymmetric pinning sites. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1367-2630/15/6/063022

Additional details

Publishing Information

Journal Title
New Journal of Physics
Journal Volume
15
Journal Issue
6
Journal Page Range
[13 p.]
ISSN
1367-2630

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44119889
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ASYMMETRY; NUCLEATION; ROUGHNESS; SURFACES; VORTICES
Descriptors DEC
SURFACE PROPERTIES