High spatial resolution HgI2 linear array based on resistive charge division
Creators
- 1. Ist. TESRE/CNR, Bologna (Italy)
- 2. Sezione INFN di Napoli, INFN, Napoli (Italy)
- 3. Naples Univ. (Italy). Dipt. di Scienze Fisiche
- 4. Centre National de la Recherche Scientifique, 67 - Strasbourg (France). Lab. PHASE
Description
Newly designed HgI2 linear arrays based on resistive charge division, obtained by depositing a Ge surface resistive layer (with typical interstrip resistances of ∼4 and 6 MΩ) between the read-out Pd strips, have been fabricated. These detectors, coupled with specially designed front-end electronics, have shown a high detection efficiency over a large active detection area and an energy resolution of 20% for X-ray energy Ex = 22 keV, estimated to become < 5% at Ex > 100 keV. Further, a spatial sensitivity of ∼ 10 μm and a spatial resolution of ∼ 100 μm have been obtained at 30 keV, by making use, for a fine spatial characterization of the devices, of a laser beam spot 50 μm in diameter with wavelength tuned to match the crystal band gap (582 nm). These devices could be successfully employed in basic research (for example Bragg X-ray spectrometry) and for radiological and high-energy (Ex > 100 keV) astrophysical applications. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 390
- Journal Issue
- 1-2
- Journal Page Range
- p. 175-182.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 28059809
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BRAGG REFLECTION; EFFICIENCY; ENERGY RESOLUTION; HGI2 SEMICONDUCTOR DETECTORS; KEV RANGE 100-1000; POSITION SENSITIVE DETECTORS; SENSITIVITY; SPATIAL RESOLUTION; X-RAY DETECTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- DETECTION; ENERGY RANGE; KEV RANGE; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; REFLECTION; RESOLUTION; SEMICONDUCTOR DETECTORS; SPECTROSCOPY