Published April 1, 2004
| Version v1
Journal article
Hysteresis in the melting kinetics of Bi nanoparticles
Description
Structural properties as a function of temperature of bismuth nanocrystals embedded in amorphous germanium thin films, synthesised by laser ablation are investigated by Raman spectroscopy and X-ray diffraction. In addition to temperature anharmonic effects, Raman spectroscopy results reveal a melting solidification hysteresis, which takes place below the melting point of bulk bismuth. Furthermore, preliminary X-ray diffraction results suggest that the nanocrystals change in structure upon heating until melting occurs. However, the nanocrystals recover their original structure once the sample is cooled at room temperature
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2003.11.134;
- PII
- S0040609003017395;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 453-454
- Journal Issue
- 3
- Journal Page Range
- p. 467-470
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Symposium H on photonic processing of surfaces, thin films and devices
- Acronym
- E-MRS 2003 spring conference
- Dates
- 10-13 Jun 2003
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37016786
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BISMUTH; GERMANIUM; HYSTERESIS; KINETICS; MELTING; MELTING POINTS; NANOSTRUCTURES; RAMAN SPECTROSCOPY; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FILMS; LASER SPECTROSCOPY; METALS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SCATTERING; SPECTROSCOPY; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.