Published April 1, 2004 | Version v1
Journal article

Hysteresis in the melting kinetics of Bi nanoparticles

Description

Structural properties as a function of temperature of bismuth nanocrystals embedded in amorphous germanium thin films, synthesised by laser ablation are investigated by Raman spectroscopy and X-ray diffraction. In addition to temperature anharmonic effects, Raman spectroscopy results reveal a melting solidification hysteresis, which takes place below the melting point of bulk bismuth. Furthermore, preliminary X-ray diffraction results suggest that the nanocrystals change in structure upon heating until melting occurs. However, the nanocrystals recover their original structure once the sample is cooled at room temperature

Additional details

Identifiers

DOI
10.1016/j.tsf.2003.11.134;
PII
S0040609003017395;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
453-454
Journal Issue
3
Journal Page Range
p. 467-470
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Symposium H on photonic processing of surfaces, thin films and devices
Acronym
E-MRS 2003 spring conference
Dates
10-13 Jun 2003
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37016786
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BISMUTH; GERMANIUM; HYSTERESIS; KINETICS; MELTING; MELTING POINTS; NANOSTRUCTURES; RAMAN SPECTROSCOPY; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FILMS; LASER SPECTROSCOPY; METALS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SCATTERING; SPECTROSCOPY; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.