Published 1985
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Proceedings of a symposium(short term research meeting) on research of semiconductors with research reactors
Description
This is a proceeding of a symposium (short term research meeting) on research of semiconductors with research reactors held at the Research Reactor Institute, Kyoto University on January 21 and 22 in 1985. At first an introductory talk on reactor neutron fields and semiconductors was given. Then there were four sessions as following: (1) Structure analysis by neutron diffraction. (2) Impurity measurements by neutron activation analysis, radioactive tracer technique and solid state track detector technique. (3) Neutron transmutation doping. (4) Irradiation effects of semiconductor materials and devices. (author)
Availability note (English)
MF available from INIS under the Report Number.
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Additional details
Publishing Information
- Imprint Pagination
- 76 p.
- Report number
- KURRI-TR--263
Conference
- Title
- Symposium (short term research meeting) on research of semiconductors with research reactors.
- Dates
- 21-22 Jan 1985.
- Place
- Kumatori, Osaka (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 17079744
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL DOPING; DEFECTS; DIELECTRIC TRACK DETECTORS; ELECTRON SPIN RESONANCE; IMPURITIES; IRRADIATION; NEUTRON ACTIVATION ANALYSIS; NEUTRON DIFFRACTION; NEUTRON SPECTRA; PHYSICAL RADIATION EFFECTS; RESEARCH REACTORS; SEMICONDUCTOR MATERIALS; TRACER TECHNIQUES; TRANSMUTATION
- Descriptors DEC
- ACTIVATION ANALYSIS; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ISOTOPE APPLICATIONS; MAGNETIC RESONANCE; MATERIALS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; RADIATION EFFECTS; REACTORS; RESEARCH AND TEST REACTORS; RESONANCE; SCATTERING; SPECTRA