Published July 27, 2016 | Version v1
Journal article

The nature of the Fe-graphene interface at the nanometer level

  • 1. Department of Chemical Sciences, University of Padova, via Marzolo 1, 35135, Padova (Italy)
  • 2. Department of Chemical and Biological Engineering, University of Wisconsin-Madison, Madison, WI 53706 (United States)
  • 3. Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, via dei Musei 41, I-25121 Brescia (Italy)
  • 4. Sincrotrone Trieste S.C.p.A., Area Science Park-Basovizza, Strada Statale 14 Km 163.5, I-34149 Trieste (Italy)
  • 5. Istituto Officina dei Materiali (IOM)-CNR, Laboratorio TASC, Area Science Park-Basovizza, Strada Statale 14 Km 163.5, I-34149 Trieste (Italy)

Description

The emerging fields of graphene-based magnetic and spintronic devices require a deep understanding of the interface between graphene and ferromagnetic metals. This work reports a detailed investigation at the nanometer level of the Fe–graphene interface carried out by angle-resolved photoemission, high-resolution photoemission from core levels, and scanning tunnelling microscopy. Quasi-freestanding graphene was grown on Pt(111), and the iron film was either deposited atop or intercalated beneath graphene. Calculations and experimental results show that iron strongly modifies the graphene band structure and lifts its π band spin degeneracy.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1741
Journal Issue
1
Journal Page Range
vp.
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
12. international conference on synchrotron radiation instrumentation
Acronym
SRI2015
Dates
6-10 Jul 2015
Place
New York, NY (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48054449
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CLATHRATES; EQUIPMENT; FILMS; GRAPHENE; INTERFACES; IRON; PHOTOEMISSION; RESOLUTION; SCANNING TUNNELING MICROSCOPY; SPIN; TUNNEL EFFECT
Descriptors DEC
ANGULAR MOMENTUM; CARBON; ELEMENTS; EMISSION; METALS; MICROSCOPY; NONMETALS; PARTICLE PROPERTIES; SECONDARY EMISSION; TRANSITION ELEMENTS

Optional Information

Notes
(c) 2016 Author(s)