Implementation of optical OR and NOR gates using Mach-Zehnder interferometers
Creators
- 1. Faculty of Engineering, Sheikhbahaee University, Isfahan (Iran, Islamic Republic of)
Description
The ever increasing growth of data and the need for data transmission emphasizes the requirement of full-optical telecommunication. Therefore, it seems critical to utilize optical integrated circuits, including optical gates, optical dividers, optical converters, etc. In this regard, we introduce a new structure for OR/NOR logical gate. The OR/NOR logical gate is simulated by applying Mach–Zehnder interferometer (MZI) where switching between bar and cross states is implemented by using the electro-optic properties of Lithium Niobate and coupling mode theory. Two different designs for the OR/NOR basic gate are simulated by OptiBPM software. Simulation results show that designed gates implement OR/NOR logical gate completely acceptable. The advantage of these designed gates is that waveguides have smaller length and do not pass above each other; thereby it would be possible to do layering by using fewer layers. Also, results show that output intensity in '1' logic state is more than 95% of input light and in '0' logic state, is less than 5% of the input light. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2399-6528/abade0Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics Communications
- Journal Volume
- 4
- Journal Issue
- 8
- Journal Page Range
- [9 p.]
- ISSN
- 2399-6528
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53010810
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- COMPUTER CODES; COMPUTERIZED SIMULATION; COUPLING; DATA TRANSMISSION; DESIGN; INTEGRATED CIRCUITS; LITHIUM; MACH-ZEHNDER INTERFEROMETER; NIOBATES; OPTICS; WAVEGUIDES
- Descriptors DEC
- ALKALI METALS; COMMUNICATIONS; ELECTRONIC CIRCUITS; ELEMENTS; INTERFEROMETERS; MEASURING INSTRUMENTS; METALS; MICROELECTRONIC CIRCUITS; NIOBIUM COMPOUNDS; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; SIMULATION; TRANSITION ELEMENT COMPOUNDS