Published March 2007
| Version v1
Journal article
Fabrication of tungsten tip for scanning tunneling microscope by the lever principle
- 1. Chinese Academy of Sciences, Beijing (China). Graduate School
- 2. Chinese Academy of Sciences, Shanghai (China). Shanghai Inst. of Applied Physics
Description
A novel experimental setup was designed to fabricate tungsten tips for scanning tunneling microscope (STM), based on simple mechanical lever principle. The equipment can quickly separate the tip from electrolyte to avoid the further etching of the fine-shaped tungsten tip. The setup is advantageous for its simplicity over complex electronic control systems. The use result in scanning electron microscope demonstrates that the radius of the tip can reach 50 nm. The tip was applied to scan the surface of highly-oriented pyrolytic graphite, and the results were satisfactory. It is shown that the tip can be used for the scanning of atomically resolved images. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 30
- Journal Issue
- 3
- Journal Page Range
- p. 200-203
- ISSN
- 0253-3219
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 39114849
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHEMICAL PREPARATION; CONTROL SYSTEMS; ELECTROCHEMICAL CORROSION; ELECTROLYTES; FABRICATION; GRAPHITE; IMAGES; PROBES; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACES; TUNGSTEN
- Descriptors DEC
- CARBON; CHEMICAL REACTIONS; CORROSION; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; MINERALS; NONMETALS; REFRACTORY METALS; SYNTHESIS; TRANSITION ELEMENTS
Optional Information
- Notes
- 6 figs., 13 refs.