Published October 1, 2010
| Version v1
Journal article
Electronic structure and thermoelectric properties of Bi2Te3 crystals and graphene-doped Bi2Te3
Creators
- 1. Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, NSW 2522 (Australia)
- 2. Department of Physics, National Dong Hwa University, Hualien 97401, Taiwan (China)
Description
The electronic structure and thermoelectric properties of Bi2Te3 single crystals and graphene-doped Bi2Te3 polycrystalline samples were investigated with the aid of first-principles calculations, X-ray diffraction, scanning electron microscopy, Rietveld refinement, and thermal and transport measurements. It was found that the p electrons from the Bi and Te atoms are responsible for the density of states near the Fermi level. Experimental results show that the graphene-doped Bi2Te3 exhibits lower thermal conductivity and has a higher figure-of-merit than the single crystals.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2010.03.124Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2010.03.124;
- PII
- S0040-6090(10)00453-0;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 518
- Journal Issue
- 24
- Journal Page Range
- p. e57-e60
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Taiwan Association for Coatings and Thin Films Technology international thin films conference
- Acronym
- TACT 2009
- Dates
- 14-16 Dec 2009
- Place
- Taipei, Taiwan (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42067157
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BISMUTH TELLURIDES; DOPED MATERIALS; ELECTRONIC STRUCTURE; FERMI LEVEL; MONOCRYSTALS; PERFORMANCE; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; THERMAL CONDUCTIVITY; THERMOELECTRIC MATERIALS; THERMOELECTRIC PROPERTIES; X-RAY DIFFRACTION
- Descriptors DEC
- BISMUTH COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ENERGY LEVELS; MATERIALS; MICROSCOPY; PHYSICAL PROPERTIES; SCATTERING; TELLURIDES; TELLURIUM COMPOUNDS; THERMODYNAMIC PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.