Proton elastic scattering cross section on carbon from 350 keV to 3 MeV
- 1. Florence Univ. (Italy). Ist. di Fisica
Description
Using our set-up for the simultaneous many-angle detection of backscattered particles, we have measured the proton elastic scattering cross section on carbon, in the angular range from 100 to 170 (in steps of 5 ) and for beam energies from 350 keV to 3 MeV. Thin self-supporting natural carbon foils have been used, ∝13 μg/cm2 for the measurements from 350 to 700 keV, ∝50 μg/cm2 above 700 keV. A scattering spectrum was also simultaneously recorded at 15 (purely Rutherford cross section at all energies) for normalisation purposes. Thanks to the simultaneous acquisition of this spectrum, the uncertainties in the effective target thickness and in the integrated beam charge do not affect the deduced backscattering cross section values, whose overall accuracy is estimated to be ±4% (maximum error) at all the beam energies and angles. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 136-138
- Journal Page Range
- p. 86-90
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 13. international conference on ion beam analysis (IBA-13)
- Dates
- 27 Jul - 1 Aug 1997
- Place
- Lisbon (Portugal)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 29042318
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; DATA ANALYSIS; ENERGY LOSSES; ERRORS; ION MICROPROBE ANALYSIS; PROTON REACTIONS; PROTONS; RADIATION DETECTORS; RUTHERFORD SCATTERING; SILICON DIODES
- Descriptors DEC
- BARYON REACTIONS; BARYONS; CATIONS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ELASTIC SCATTERING; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRON REACTIONS; HADRONS; HYDROGEN IONS; HYDROGEN IONS 1 PLUS; IONS; MEASURING INSTRUMENTS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUCLEAR REACTIONS; NUCLEON REACTIONS; NUCLEONS; SCATTERING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES
Optional Information
- Notes
- 9 refs.