Evaluation of hot spots parameters by simple soft x-ray diagnostics
Creators
- 1. Institute of Plasma Physics, Czech. Academy of Sciences, Prague (Czechoslovakia)
- 2. Institute of Physics, Czech. Academy of Sciences, Prague (Czechoslovakia)
Description
The properties of the hot spots in Ar and Ne plasma of gas puff z-pinch were investigated. Pinhole cameras with entrance diameter 13--250 μm, XRD, surface-barrier detectors and flat crystal spectrographs with Si and KAP crystals were used for spatially, temporally and spectrally resolved soft x-ray diagnostics. The diameters of Ar (25--30 μm) and Ne (40 μm) hot spots were found and K-lines in x-ray spectra were registered. The temporal evolution of x-rays within ∼600 ns was observed; the upper estimate of hot spots lifetime did not exceed 50 ns. The described processing and curve fitting of He-like Ar XVII lines provided the values of electron temperature and density in Ar hot spots Te=1.0--1.1 keV, ne=(1.8--4.0)x1027 m-3, which support the idea of the Bennett equilibrium validity for the spots
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 195
- Journal Issue
- 1
- Series
- AIP Conf. Proc.
- Journal Page Range
- 474-480
- ISSN
- 0094-243X
- CODEN
- APCPC
Conference
- Title
- 2. international conference on high-density pinches (ICHDP-2).
- Dates
- 26-28 Apr 1989.
- Place
- Laguna Beach, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22010786
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ARGON; ARGON IONS; ELECTRON DENSITY; ELECTRON TEMPERATURE; EXPERIMENTAL DATA; HOT SPOTS; LINEAR Z PINCH DEVICES; NEON; PINCH EFFECT; PLASMA DIAGNOSTICS; PLASMA PRODUCTION; SOFT X RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; DATA; ELECTROMAGNETIC RADIATION; ELEMENTS; INFORMATION; IONIZING RADIATIONS; IONS; LINEAR PINCH DEVICES; NONMETALS; NUMERICAL DATA; OPEN PLASMA DEVICES; PINCH DEVICES; RADIATIONS; RARE GASES; SPECTROSCOPY; THERMONUCLEAR DEVICES; X RADIATION
Optional Information
- Secondary number(s)
- CONF-8904107--.