A compact soft X-ray spectrograph combining high efficiency and resolution
- 1. Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg (Germany)
- 2. Friedrich-Schiller-Universitaet Jena, Max-Wien-Platz 1, 07743 Jena (Germany)
- 3. European XFEL GmbH, Albert-Einstein-Ring 19, 22761 Hamburg (Germany)
Description
A compact and light weight soft X-ray spectrograph covering 5-35 nm and employing a toroidal mirror and a variable line space reflection grating has been newly developed. Particular emphasis has been placed on achieving a large collection solid angle (1.9 x 10-3 sr) and a high efficiency of the components in order to enable Thomson Scattering plasma diagnostics which has a small total cross section (6.65 x 10-25 cm2). The instrument achieves a signal-to-noise ratio of 5 with a 13.5 nm source which isotropically emits 2.5 x 105 photons. A resolution λ/Δλ = 330 was measured at 21 nm and the dispersion was calibrated. The instrument is housed inside a DN 100 CF ultra high vacuum manipulator (43 x 46 x 47 cm3) which allows positioning relative to the source within ±5 mm and ±50 mm in X,Y and Z direction, respectively. It can be used with or without entrance pinhole and is equipped with a motorized grating, a filter wheel with five filters, and a shutter. Altogether, these features make the spectrograph a versatile instrument which can be employed in a variety of physics applications such as line and bremsstrahlung spectroscopy or Thomson scattering.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/5/02/P02004Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 5
- Journal Issue
- 02
- Journal Page Range
- p. P02004
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41100495
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BREMSSTRAHLUNG; COMPACTS; EFFICIENCY; FILTERS; GRATINGS; MANIPULATORS; MIRRORS; P INVARIANCE; PHOTONS; PLASMA DIAGNOSTICS; POSITIONING; RESOLUTION; SIGNAL-TO-NOISE RATIO; SOFT X RADIATION; SPECTROSCOPY; THOMSON SCATTERING; TOTAL CROSS SECTIONS
- Descriptors DEC
- BOSONS; CROSS SECTIONS; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EQUIPMENT; INELASTIC SCATTERING; INVARIANCE PRINCIPLES; IONIZING RADIATIONS; LABORATORY EQUIPMENT; MASSLESS PARTICLES; MATERIALS HANDLING EQUIPMENT; RADIATIONS; REMOTE HANDLING EQUIPMENT; SCATTERING; X RADIATION