Published 2003
| Version v1
Journal article
Measurements at the analog test chip for the ATLAS experiment
Creators
- 1. Physikalisches Inst., Univ. Bonn (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Messungen an dem Analog-Test-Chip fuer das Atlas-Experiment
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Volume
- 38
- Journal Issue
- 2
- Journal Page Range
- p. 42
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 2003 spring meeting of the German Physical Society, Particle Physics Section, with physics and book exhibition
- Original Conference Title
- Fruehjahrstagung 2003 der Deutschen Physikalischen Gesellschaft (DPG), Fachverband Teilchenphysik, mit Physik- und Buchausstellung
- Dates
- 10-13 Mar 2003
- Place
- Aachen (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 34036198
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- ANALOG SYSTEMS; INTEGRATED CIRCUITS; MODULAR STRUCTURES; POSITION SENSITIVE DETECTORS; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS