Dislocation induced twin growth and formation of basal stacking faults in { 10 1 ¯ 2 } twins in pure Mg
Creators
- 1. Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904 (United States)
- 2. Department of Mechanical Engineering, Mississippi State University, Starkville, MS, 39762 (United States)
- 3. Center for Advanced Vehicular Systems, Mississippi State University, Starkville, MS, 39759 (United States)
- 4. Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM, 87545 (United States)
Description
In situ tension experiments were performed on oriented pure Mg single crystal specimens, within a transmission electron microscope. Several microstructure evolutions directly related to the interaction between basal dislocations and tension twin boundary (TB) were observed: (1) dislocation slip-induced twin growth, (2) formation of stacking faults in the wake of the advancing TB, and (3) development of large interfacial serrations. The associated defects in the twin crystal and on the TB are characterized and quantified, leading to the verification and further elucidation of a dislocation transmutation reaction proposed five decades ago. Aided by molecular dynamics simulations, it is concluded that the slip-twin interaction is not a slip transfer process. When the TB advances, the unit process is the transformation of each basal dislocation to a sessile partial dislocation inside the twin crystal, trailing a SF. The glissile-to-sessile transition is therefore analogous to the Basinski mechanism. Twinning disconnections (TDs) are generated as a by-product of the dislocation transformation at the TB. Driven by the stress field of basal dislocations in the matrix, the TDs glide on the TB, which firstly produces TB migration and secondly dissipates the strain energy of the incident dislocations. The pile-up of the locally generated TD was observed to induce the formation of severe interfacial serrations, which do not stop TB migration.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2018.12.003Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2018.12.003;
- PII
- S1359645418309455;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 165
- Journal Page Range
- p. 471-485
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 56008042
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BY-PRODUCTS; DEFECTS; DISLOCATIONS; INTERACTIONS; MICROSTRUCTURE; MOLECULAR DYNAMICS METHOD; MONOCRYSTALS; SIMULATION; SLIP; STACKING FAULTS; STRESSES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CALCULATION METHODS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ELECTRON MICROSCOPY; LINE DEFECTS; MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.