Chemical characterization of detector grade materials: facilities and expertise at CCCM

High purity materials at present being analysed at CCCM are Ga, Ge, Te, In, Sb, Cd at ultra trace analysis and SiO2, As2O3 at bulk analysis facilities. The methods adopted use clean lab technology with wet chemical processing. Detection limits obtained in these methods are in parts per billion which is suitable for analysis of 99.9999 (6N) to 99.99999 (7N) pure materials. Analysis of detector grade single crystals places new challenges as the purity levels are an order or more than the above materials. The conventional methods may not work. Therefore newer methods preferably without any sample preparation with very high sensitivity has to be explored and applied. (author)