Comparison of levitation forces of the cc-tapes stacks from different manufacturers
Creators
- 1. National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe sh. 31, 115409 Moscow (Russian Federation)
Description
High-temperature superconductors (HTSC) have a significant potential for application in systems based on magnetic levitation. The wide spread of second-generation HTSC tapes (CC- tape from coated conductors) allows the use of stacks of CC-tapes as an alternative to bulk superconductors, particularly in levitation systems. The paper presents the results of research of CC-tapes of various manufacturers - SuNAM, THEVA and SuperOx. The tapes were cut into square 12 mm × 12 mm fragments and stacked in stacks, the number of tapes varying from 10 to 100. The measured dependences of the levitation force on the distance between the magnet and the stack have similar patterns for tapes of all manufacturers - the force of interaction increases with increasing thickness of stacks. However, the influence of the thickness of the stack on the levitation force for different CC-tapes is of a different nature. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1238/1/012005Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1238
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 4. International Conference on Laser, Plasma Research and Technologies
- Acronym
- LaPlas 2018
- Dates
- 30 Jan - 1 Feb 2018
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53055864
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- INTERACTIONS; MAGNETS; SUPERCONDUCTORS; THICKNESS
- Descriptors DEC
- DIMENSIONS; EQUIPMENT