Published 2014 | Version v1
Miscellaneous

Analysis of modern methods for registration of ionizing radiation and the future trends for development of semiconductor detectors

  • 1. Institute for Nuclear Research, NANU, Kyiv (Ukraine)

Description

no abstract available

Part of:
Annual report-2013. Institute for Nuclear Research of National Academy of Sciences of Ukraine

Additional details

Additional titles

Original title (English)
Shchoryichnik-2013. Natsyional'na Akademyiya Nauk Ukrayini Yinstitut Yadernikh Doslyidzhen'

Publishing Information

Publisher
INR NAN of Ukraine
Imprint Place
Kyiv (Ukraine)
Imprint Title
Annual report-2013. Institute for Nuclear Research of National Academy of Sciences of Ukraine
Imprint Pagination
168 p.
Journal Page Range
p. 94
Report number
INIS-UA--193

INIS

Country of Publication
Ukraine
Country of Input or Organization
Ukraine
INIS RN
45097442
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature, No Abstract
Descriptors DEI
COMPARATIVE EVALUATIONS; IONIZING RADIATIONS; MEASURING METHODS; SEMICONDUCTOR DETECTORS; SI MICROSTRIP DETECTORS; USES
Descriptors DEC
EVALUATION; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS

Optional Information

Notes
Imprint:Shchoryichnik-2013. Natsyional'na Akademyiya Nauk Ukrayini Yinstitut Yadernikh Doslyidzhen'