Evaluation of phase sensitive detection method and Si avalanche photodiode for radiation thermometry

We report the evaluation of Si avalanche photodiodes (APDs) for use in radiation thermometry as an alternative to Si photodiodes. We compared their performance when operated under phase sensitive detection (PSD), where the signal is modulated, and direct detection (DD) methods. A Si APD was compared with a Si photodiode with reference black body temperatures of 275 to 600°C, in terms of the mean output voltage and signal-to-noise ratio (SNR), measured at different APD gain values. We found that using both PSD and DD methods, the high internal gain of the Si APD achieved a lower minimum detection temperature in order to satisfy a specific minimum output voltage of the detector-preamplifier combination employed. The use of PSD over DD for the Si APD allowed for improved performance of the thermometer, with a lower minimum measurable temperature, as well as improvement in the SNR. For instance we found that at 350°C, the Si APD biased at 150 V using PSD can provide ∼ 88 times enhancement in the system SNR over that of a Si photodiode using DD. A corresponding temperature error of ±0.05°C was achieved using the APD with PSD compared to an error of ±2.75°C measured using the Si photodiode with DD.