Published August 2010 | Version v1
Journal article

Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS1-xSex)1.16(Nb1.036S2)2

  • 1. Faculte de Chimie, Laboratoire Sciences des Materiaux, USTHB, BP32 16000 Alger (Algeria)
  • 2. Inorganic Chemistry, Arrhenius Laboratory, Stockholm University, 10691 Stockholm (Sweden)
  • 3. Centro de Microscopia Electronica, Universidad Complutense, 28040 Madrid (Spain)
  • 4. Dpto. Inorganica, Fac. C.C. Quimicas, Universidad Complutense, 28040 Madrid (Spain)

Description

In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS1-xSex) slabs stacking alternately with double NbS2 layers and both can be treated as separate monoclinic subsystems. The (SbS1-xSex) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX5} square pyramids joined by edges (X: S, Se); the NbS2 layers consist of {NbS6} trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS2 structure type. Both sublattices have the same lattice parameters a = 5.7672(19) A, c = 17.618(6) A and β = 96.18(3)o, with incommensurability occurring along the b direction: b1 = 3.3442(13) A for the NbS2 subsystem and b2 = 2.8755(13) A for the (SbS1-xSex) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS1-xSex) subsystem is subjected to extended defects along the stacking direction.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.materresbull.2010.04.011

Additional details

Identifiers

DOI
10.1016/j.materresbull.2010.04.011;
PII
S0025-5408(10)00133-9;

Publishing Information

Journal Title
Materials Research Bulletin
Journal Volume
45
Journal Issue
8
Journal Page Range
p. 982-988
ISSN
0025-5408
CODEN
MRBUAC

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45028262
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CRYSTAL GROWTH; DIFFUSE SCATTERING; LATTICE PARAMETERS; LAYERS; MONOCLINIC LATTICES; MONOCRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.