Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS1-xSex)1.16(Nb1.036S2)2
Creators
- 1. Faculte de Chimie, Laboratoire Sciences des Materiaux, USTHB, BP32 16000 Alger (Algeria)
- 2. Inorganic Chemistry, Arrhenius Laboratory, Stockholm University, 10691 Stockholm (Sweden)
- 3. Centro de Microscopia Electronica, Universidad Complutense, 28040 Madrid (Spain)
- 4. Dpto. Inorganica, Fac. C.C. Quimicas, Universidad Complutense, 28040 Madrid (Spain)
Description
In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS1-xSex) slabs stacking alternately with double NbS2 layers and both can be treated as separate monoclinic subsystems. The (SbS1-xSex) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of {SbX5} square pyramids joined by edges (X: S, Se); the NbS2 layers consist of {NbS6} trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS2 structure type. Both sublattices have the same lattice parameters a = 5.7672(19) A, c = 17.618(6) A and β = 96.18(3)o, with incommensurability occurring along the b direction: b1 = 3.3442(13) A for the NbS2 subsystem and b2 = 2.8755(13) A for the (SbS1-xSex) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS1-xSex) subsystem is subjected to extended defects along the stacking direction.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.materresbull.2010.04.011Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2010.04.011;
- PII
- S0025-5408(10)00133-9;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 45
- Journal Issue
- 8
- Journal Page Range
- p. 982-988
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45028262
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL GROWTH; DIFFUSE SCATTERING; LATTICE PARAMETERS; LAYERS; MONOCLINIC LATTICES; MONOCRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.