Published April 1985 | Version v1
Report

Cosmic ray simulation and testing program. Final Report, January-November 1984

Description

Single event upset (SEU) and latchup vulnerabilities were determined for a number of parts of interest to NASA space programs. In cases where a threshold linear energy transfer (LET) for SEU could be measured, an upset rate in a low inclination Space Shuttle orbit was computed. The predicted upset rates are extremely low, except for the devices with LET thresholds below the geomagnetic cutoff for altitude and inclination of the Space Shuttle orbit. While some of the devices do exhibit latchup, the cross sections and threshold LETs are such that the risk associated with flying these devices in low, near equatorial orbits is small if not negligible

Availability note (English)

Available from NTIS, PC A04/MF A01.

Additional details

Publishing Information

Imprint Pagination
54 p.
Report number
N--86-23551

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17089974
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Numerical Data, Non-conventional Literature
Descriptors DEI
ELECTRONIC EQUIPMENT; EXPERIMENTAL DATA; LET; MICROPROCESSORS; PHYSICAL RADIATION EFFECTS
Descriptors DEC
DATA; ELECTRONIC CIRCUITS; ENERGY TRANSFER; EQUIPMENT; INFORMATION; MICROELECTRONIC CIRCUITS; NUMERICAL DATA; RADIATION EFFECTS

Optional Information

Secondary number(s)
NASA-CR--177860.