Published April 1985
| Version v1
Report
Cosmic ray simulation and testing program. Final Report, January-November 1984
Description
Single event upset (SEU) and latchup vulnerabilities were determined for a number of parts of interest to NASA space programs. In cases where a threshold linear energy transfer (LET) for SEU could be measured, an upset rate in a low inclination Space Shuttle orbit was computed. The predicted upset rates are extremely low, except for the devices with LET thresholds below the geomagnetic cutoff for altitude and inclination of the Space Shuttle orbit. While some of the devices do exhibit latchup, the cross sections and threshold LETs are such that the risk associated with flying these devices in low, near equatorial orbits is small if not negligible
Availability note (English)
Available from NTIS, PC A04/MF A01.Additional details
Publishing Information
- Imprint Pagination
- 54 p.
- Report number
- N--86-23551
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17089974
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Numerical Data, Non-conventional Literature
- Descriptors DEI
- ELECTRONIC EQUIPMENT; EXPERIMENTAL DATA; LET; MICROPROCESSORS; PHYSICAL RADIATION EFFECTS
- Descriptors DEC
- DATA; ELECTRONIC CIRCUITS; ENERGY TRANSFER; EQUIPMENT; INFORMATION; MICROELECTRONIC CIRCUITS; NUMERICAL DATA; RADIATION EFFECTS
Optional Information
- Secondary number(s)
- NASA-CR--177860.