Published September 1990
| Version v1
Journal article
X-ray fluorescence analysis of Se-Te system solid solution thin films with thickness composition gradient
Description
Technique of quantitative X-ray fluorescence rapid analysis of Se-Te system solid solution thin films with composition gradient by thickness is suggested. Distribution solid solution components by thickness of varizonal layer obtained at equilibrium motion of substrate through condensation zone with component vapour relative content gradient is studied
Additional details
Additional titles
- Original title (Russian)
- Рентгенофлуоресцентный анализ тонких пленок твердых растворов системы Се-Те с градиентом состава по толщине
Publishing Information
- Journal Title
- Izvestiya Akademii Nauk SSSR, Neorganicheskie Materialy
- Journal Volume
- 26
- Journal Issue
- 9
- Series
- Izv. Akad. Nauk SSSR, Neorg. Mater.
- Journal Page Range
- 1867-1870
- ISSN
- 0002-337X
- CODEN
- IVNMA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 23034065
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- FILMS; QUANTITY RATIO; SELENIUM ALLOYS; SOLID SOLUTIONS; SPATIAL DISTRIBUTION; SPRAYED COATINGS; SUBSTRATES; TELLURIUM ALLOYS; THICKNESS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALLOYS; CHEMICAL ANALYSIS; COATINGS; DIMENSIONS; DISPERSIONS; DISTRIBUTION; HOMOGENEOUS MIXTURES; MIXTURES; NONDESTRUCTIVE ANALYSIS; SOLUTIONS; X-RAY EMISSION ANALYSIS