Published May 1, 1995 | Version v1
Journal article Metadata-only

Higher order structure analysis of nano-materials by spectral reflectance of laser-plasma soft x-ray

Creators

  • 1. TOYOTA Central Research and Development Laboratories, Inc., Nagakute, Aichi, 480-11 (Japan)

Description

We have proposed a new experimental arrangement to measure spectral reflectance of nano-materials for analyzing higher order structure with laser-plasma soft x-rays. Structure modification of annealed Mo/Si multilayers and a nylon-6/clay hybrid with poor periodicity was investigated. The measurement of the spectral reflectance of soft x-rays from laser-produced plasma was found to be a useful method for the structure analysis of nano-materials, especially those of rather poor periodicity

Additional details

Identifiers

DOI
10.1063/1.47939;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
332
Journal Issue
1
Journal Page Range
p. 468-472
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
X-ray lasers 1994
Acronym
4. international colloquium
Dates
15-20 May 1994
Place
Williamsburg, VA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40032444
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; CLAYS; INTERFACES; LASER-PRODUCED PLASMA; LAYERS; MODIFICATIONS; MOLYBDENUM; NANOSTRUCTURES; NYLON; PERIODICITY; SILICON; SOFT X RADIATION; SPECTRAL REFLECTANCE; STRUCTURAL CHEMICAL ANALYSIS
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; HEAT TREATMENTS; IONIZING RADIATIONS; MATERIALS; METALS; MINERALS; OPTICAL PROPERTIES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; PHYSICAL PROPERTIES; PLASMA; PLASTICS; POLYAMIDES; POLYMERS; RADIATIONS; REFRACTORY METALS; SEMIMETALS; SILICATE MINERALS; SYNTHETIC MATERIALS; TRANSITION ELEMENTS; VARIATIONS; X RADIATION

Optional Information

Notes
(c) 1994 American Institute of Physics.