X-ray and charged particle detection with CsI(Tl) layer coupled to a-Si:H photodiode layers
Creators
- 1. Lawrence Berkeley Lab., CA (United States)
- 2. Xerox Palo Alto Research Center, CA (United States)
Description
This paper reports on a compact real-time X-ray and charged particle imager with digitized position output built either by coupling a fast scintillator to a photodiode array or by forming one on a photodiode array directly. CsI(Tl) layers 100-1000 μm thick were evaporated on glass substrates from a crystal CsI(Tl). When coupled to a crystalline Si or amorphous silicon (a-Si:H) photodiode and exposed to calibrated X-ray pulses, their light yields and speed were found to be comparable to those of a crystal CsI(Tl). Single β particle detection was demonstrated with this combination. The light spread inside evaporated CsI(Tl) was suppressed by its columnar structure. Scintillation detection gives much larger signals than direct X-ray detection due to the increased energy deposition in the detector material. Fabrication of monolithic type X-ray sensors consisting of CsI + a-Si:H photodiodes is discussed
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- IEEE nuclear science symposium conference record emdash 1990
- Imprint Pagination
- 1636 p.
- Journal Page Range
- p. 198-205.
Conference
- Title
- 1990 Institute of Electrical and Electronics Engineers (IEEE) nuclear science symposium.
- Dates
- 22-27 Oct 1990.
- Place
- Arlington, VA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22091640
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BETA DETECTION; CESIUM COMPOUNDS; CHARGED PARTICLE DETECTION; FABRICATION; GLASS; IODINE; LAYERS; MATERIALS; PERFORMANCE TESTING; PHOTODIODES; RADIATION DETECTORS; SCINTILLATION COUNTING; SILICON; SUBSTRATES; THALLIUM; X-RAY DETECTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; COUNTING TECHNIQUES; DETECTION; ELEMENTS; HALOGENS; MEASURING INSTRUMENTS; METALS; NONMETALS; RADIATION DETECTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; TESTING
Optional Information
- Secondary number(s)
- CONF-9010220--.