Published May 1, 2011
| Version v1
Journal article
Local field correction effect on inelastic Coulomb scattering lifetime of two-dimensional quasiparticles at low temperatures
Creators
- 1. Department of Physics, Shahid Beheshti University, G. C., Evin, 1983963113 Tehran (Iran, Islamic Republic of)
Description
We have investigated the effect of local field correction on the inelastic Coulomb scattering lifetime of high mobility quasiparticles in a quantum layer at low temperatures. By replacing temperature-dependent dynamic dielectric function for the zero-temperature one in calculations, we have considered our improved zero-temperature STLS local field correction for low temperatures in lifetime calculations and compared the results with those obtained from the RPA and Hubbard approximation. It has been found that the quasiparticle lifetime decreases by including the STLS local field factor in all temperatures, energies and layer thicknesses.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2011.02.047Additional details
Identifiers
- DOI
- 10.1016/j.physb.2011.02.047;
- PII
- S0921-4526(11)00169-4;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 406
- Journal Issue
- 10
- Journal Page Range
- p. 1883-1885
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42072011
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CORRECTIONS; COULOMB SCATTERING; DIELECTRIC MATERIALS; HUBBARD MODEL; INELASTIC SCATTERING; LAYERS; LIFETIME; QUASI PARTICLES; RANDOM PHASE APPROXIMATION; SIMULATION; TEMPERATURE DEPENDENCE; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- APPROXIMATIONS; BASIC INTERACTIONS; CALCULATION METHODS; CRYSTAL MODELS; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; INTERACTIONS; MATERIALS; MATHEMATICAL MODELS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.