Surface modification of magnetic recording media by filtered cathodic vacuum arc
Creators
- 1. Department of Mechanical Engineering, University of California, Berkeley, California 94720 (United States)
Description
Surface modification of a magnetic recording medium was accomplished by filtered cathodic vacuum arc (FCVA). The carbon overcoat of thin-film disks was removed by Ar+ ion sputter etching in vacuum to prevent oxidation of the exposed magnetic medium, which was then modified by FCVA carbon plasma under conditions of zero and -100 V pulsed substrate bias. Monte Carlo simulations performed with the T-DYN code, x-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), and surface force microscopy (SFM) provided insight into carbon implantation profiles, surface chemical composition, roughness, and nanomechanical properties of the surface-treated magnetic medium. The dependence of surface modification on the FCVA treatment conditions is discussed in the context of T-DYN, XPS, AFM, and SFM results. The findings of this study demonstrate the potential of FCVA to provide overcoat-free magnetic recording media exhibiting oxidation resistance and enhanced nanomechanical properties.
Additional details
Identifiers
- DOI
- 10.1063/1.3245399;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 106
- Journal Issue
- 9
- Journal Page Range
- p. 093504-093504.7
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41096453
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ARGON IONS; ATOMIC FORCE MICROSCOPY; BORON ALLOYS; CARBON; CHEMICAL COMPOSITION; CHROMIUM ALLOYS; COBALT ALLOYS; COMPUTERIZED SIMULATION; ETCHING; ION IMPLANTATION; MONTE CARLO METHOD; NANOSTRUCTURES; OXIDATION; PLATINUM ALLOYS; ROUGHNESS; SPUTTERING; SURFACE FORCES; SURFACE TREATMENTS; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALLOYS; CALCULATION METHODS; CHARGED PARTICLES; CHEMICAL REACTIONS; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; IONS; MICROSCOPY; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PLATINUM METAL ALLOYS; SIMULATION; SPECTROSCOPY; SURFACE FINISHING; SURFACE PROPERTIES; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- (c) 2009 American Institute of Physics