Phase composition and microhardness of rapidly quenched Al-Fe alloys after high pressure torsion deformation
Description
Aluminium-based Al-Fe alloys with Fe content of 2, 8, and 10 wt.% were prepared by rapid quenching (RQ) from the melt at a rate of 106 K/s. Structure of the alloys was examined by X-ray diffraction (XRD) and Moessbauer spectroscopy. Phase transformations of RQ alloys by high pressure torsion (HPT) were studied. Dependences of phase composition on the intensity of HPT were investigated. Microhardness measurements of HPT alloys show a considerable structural heterogeneity of specimens, the dependence of microhardness on the radius of the pills was found out. Phase composition and microhardness during the heating were investigated. At the initial step of heating (120-150 deg. C), an increase in microhardness was observed, whereas further heating leads to a decrease in the microhardness
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2003.10.207;
- PII
- S092150930301236X;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 375-377
- Journal Issue
- 1-2
- Journal Page Range
- p. 888-893
- ISSN
- 0921-5093
- CODEN
- MSAPE3
Conference
- Title
- 11. international conference on rapidly quenched and metastable materials
- Dates
- 25-30 Aug 2002
- Place
- Oxford (United Kingdom)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37059840
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALLOYS; ALUMINIUM; DEFORMATION; HEATING; MICROHARDNESS; MOESSBAUER EFFECT; PHASE TRANSFORMATIONS; QUENCHING; SOLID SOLUTIONS; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; TORSION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DISPERSIONS; ELEMENTS; HARDNESS; HOMOGENEOUS MIXTURES; MECHANICAL PROPERTIES; METALS; MIXTURES; SCATTERING; SOLUTIONS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.