Published July 2001 | Version v1
Journal article

Parallel beams from nuclear microprobe lens systems

Description

A nuclear microprobe lens system is normally used to focus a diverging beam into a fine probe. It does this by making the astigmatism terms in the first-order transfer matrix: (x/θ) and (y/phi) zero. Thus the position of a ray vector in the image plane (x,y) in the linear approximation will not depend on the divergence of the ray vector in the object plane (θ,phi). This is accomplished at the expense of magnifying the object divergence by factors (θ/θ) and (phi/phi) in the xoz and yoz planes, respectively, leading to relatively steep convergence angles at the Gaussian image plane where the specimen is located. An alternative operation mode of the nuclear microprobe lens system is possible where the convergence angle of the beam after the lens system in the linear approximation is made independent of the divergence angle of the beam prior to the lens system. In this case the terms (θ/θ) and (phi/phi) in the first-order transfer matrix are zero. This mode of the lens system does not produce a focused beam, so is most suitable for crystals without lateral structure. As an example, we present measurements from the <0 0 0 1> α-Al2O3 axis, which show significant improvement in channeling angular widths for planar channeling mode even when compared to the unfocused mode

Additional details

Identifiers

PII
S0168583X01005638;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
181
Journal Issue
1-4
Journal Page Range
p. 78-82
ISSN
0168-583X
CODEN
NIMBEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
33054238
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
BEAM FOCUSING MAGNETS; BEAM OPTICS; FOCUSING; ION BEAMS; ION MICROPROBE ANALYSIS; QUADRUPOLES
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS; EQUIPMENT; MAGNETS; MICROANALYSIS; MULTIPOLES; NONDESTRUCTIVE ANALYSIS

Optional Information

Copyright
Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.