Published 2004 | Version v1
Book Metadata-only

A new technique for diagnosing multi-charged ion beams produced by ECR ion source

Creators

  • 1. Chinese Academy of Sciences, Lanzhou (China). Inst. of Modern Phsyics

Description

no abstract available

Part of:
IMP and HIRFL annual report 2003

Additional details

Publishing Information

Publisher
Atomic Energy Press
Imprint Place
Beijing (China)
ISBN
7-5022-3209-5
Imprint Title
IMP and HIRFL annual report 2003
Imprint Pagination
187 p.
Journal Page Range
p. 148-151

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
37119327
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
APPROPRIATE TECHNOLOGY; BEAM MONITORING; BEAM PROFILES; CHARGE STATES; ECR ION SOURCES; ION BEAMS; MAGNETS
Descriptors DEC
BEAMS; EQUIPMENT; ION SOURCES; MONITORING

Optional Information

Notes
6 figs.