Published August 30, 2019 | Version v1
Journal article

Effects of cerium oxide doping on the microstructure and properties of ITO targets and the photoelectric properties of the films

  • 1. Central South University, Science and Technology on High Strength Structural Materials Laboratory (China)
  • 2. Central South University, State Key Laboratory of Powder Metallurgy (China)

Description

In the study, 0–2.0 wt% cerium oxides (CeO2) were employed to enhance the densification and properties of indium tin oxide (ITO) targets. The effects of CeO2 on the phase composition, microstructure, resistivity and fracture strength of ITO targets and the photoelectric properties of the films were investigated in detail. Experimental results show that the optimum doping amount of CeO2 is 0.5 wt%. The functions of CeO2 doping are: (1) Lowering the sintering temperature by nearly 60 °C, which is attributed to the inhibition of the decomposition of In2O3 and SnO2; (2) Refining the grain size and promoting the formation of In4Sn3O12 phase; (3) As the donor dopant to reduce the resistivity of ITO targets and strengthening the inter-facial bonding force so as to enhance the fracture strength of ITO targets; (4) Intensifying the disorder of film non-crystals, improving the surface morphology and enhancing the transmittance.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Materials Science. Materials in Electronics
Journal Volume
30
Journal Issue
16
Journal Page Range
p. 15469-15481
ISSN
0957-4522
CODEN
JSMEEV

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52024152
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CERIUM OXIDES; DOPED MATERIALS; FILMS; FRACTURE PROPERTIES; GRAIN SIZE; INDIUM OXIDES; OXIDATION; TIN OXIDES
Descriptors DEC
CERIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL REACTIONS; INDIUM COMPOUNDS; MATERIALS; MECHANICAL PROPERTIES; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; SIZE; TIN COMPOUNDS

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Copyright
Copyright (c) 2019 Springer Science+Business Media, LLC, part of Springer Nature